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Whisker Evaluation for Sn (tin) alloy plating
in electric components

We conduct tests accordingly to the Fujitsu Standards for whisker evaluation, to evaluate for the whisker growth by means of optical microscope.

What is Whisker?

Wire-shape structures grown from metal surface.
It is known that proper-whisker (whisker consists of single crystal same with that of base material constituent) grows on the Sn deposits plated on surface.
Non-proper-whisker refers to the whisker that grows with chemical reactions; e.g. silver sulfide, cupper oxide.

Optional evaluation

Upon your request, following services are available.

Measuring maximum length of whisker
Cross section sampling and observation of whisker foot by means of FIB.
Element distribution analysis by means of SEM-EDX

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Fujitsu Group Whisker evaluation standards

Fujitsu Whisker evalluation standards is now under reviewing.
The revised version will be disclosed in Februaly, 2007.
If you need to refer to the Standards as soon as possible, please contact us.
Thank you for the patience.