FUJITSU QUALITY LABORATORY

Open / Short defect

Various root cause for the electrical open in connector / relay terminals or IC.

- Fretting corrosion
- Foreing material inclusion
- Corrosion, Oxidization
- Abnormal solder joint
- Separation in bonding

Various root cause for the electrical short in printed wiring board, or other components.

- Foreign material inclusion
- Whisker
- Migration
- Deterioration in insulative material

We investigate the open / short defect through combination of the analysis techniques, based on the defect phenomenon. We also support you in establishing the corrective action.

Example: Electric open

Failure in connector

Based on the defect phenomenon, we estimated defect cause to be the fretting corrosion in connector contact area. We analyzed the contact area for the trace of the friction by SME, and then measure the oxidization level by means of EPMA and eventually confirmed that the fretting corrosion is the root cause.

Trace of the friction
OK sample
NG sample

EPMA result

Example: Electric short defect

Insulative defect (short) between component terminals

From the defect phenomenon of the electric short, we estimated ion-migration is the root cause. We confirmed the migration inside the component through the microsection, and EPMA result proved that the P contained in the mold caused Cu migration.

Polish the component surface and take microsection to identify the short location. EPMA shows Cu migration.

The know-how and analysis techniques we have can help you in the identification of the root cause. Contact us!